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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 25, Iss. 23 — Dec. 1, 2000
  • pp: 1723–1725

Nondestructive method for characterization of the second-order nonlinear profile and charge distribution in thermally poled fused silica

H. Guillet de Chatellus, S. Montant, and E. Freysz  »View Author Affiliations


Optics Letters, Vol. 25, Issue 23, pp. 1723-1725 (2000)
http://dx.doi.org/10.1364/OL.25.001723


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Abstract

Noncollinear frequency conversion of two femtosecond pulses is used to characterize the nonlinear profile induced in thermally poled fused silica. This technique permits one to deduce the nonlinear profile and the charge distribution induced by the poling treatment. These data and the current that passes through the sample during the poling are consistent with the occurrence of a built-in electric field associated with the diffusion of two ionic species.

© 2000 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(160.4330) Materials : Nonlinear optical materials

Citation
H. Guillet de Chatellus, S. Montant, and E. Freysz, "Nondestructive method for characterization of the second-order nonlinear profile and charge distribution in thermally poled fused silica," Opt. Lett. 25, 1723-1725 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-23-1723

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