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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 25, Iss. 4 — Feb. 15, 2000
  • pp: 218–220

Sampled-speckle photography for measurement of deformation

Anand Asundi  »View Author Affiliations


Optics Letters, Vol. 25, Issue 4, pp. 218-220 (2000)
http://dx.doi.org/10.1364/OL.25.000218


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Abstract

Speckles usually are of two kinds: laser speckle and white-light speckle. An additional kind, termed a sampled speckle, is proposed. Whereas laser speckles arise from multiple interference of light scattered from an object illuminated by a coherent laser beam and white-light speckles are a physically generated speckle pattern on the surface of the object, sampled speckles are generated as a result of the sampling of a digital image. The generation of these speckles and their application to displacement measurement are demonstrated.

© 2000 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(100.2000) Image processing : Digital image processing
(110.6150) Imaging systems : Speckle imaging

Citation
Anand Asundi, "Sampled-speckle photography for measurement of deformation," Opt. Lett. 25, 218-220 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-4-218


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References

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