Interferometric microimaging based on geometrical spin-redirection phase
Optics Letters, Vol. 25, Issue 7, pp. 460-462 (2000)
http://dx.doi.org/10.1364/OL.25.000460
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Abstract
A novel scheme for an interferometric microscope with which to visualize a geometrical spin-redirection phase image that represents the local inclination of microsurface structures of an object is proposed. The observed phase depends on the state of polarization and the optical constants of the object material, which enable one to distinguish the spin-redirection phase from the conventional dynamical-phase. A preliminary experiment was performed, and the phase images obtained were found to be consistent with those predicted by computer simulation based on a theoretical model.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
Citation
Alexander V. Tavrov, Yoko Miyamoto, Tsutomu Kawabata, Mitsuo Takeda, and Vladimir A. Andreev, "Interferometric microimaging based on geometrical spin-redirection phase," Opt. Lett. 25, 460-462 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-7-460
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