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Optics Letters

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  • Vol. 25, Iss. 9 — May. 1, 2000
  • pp: 628–630

Resolution enhancement in a reflection mode near-field optical microscope by second-harmonic modulation signals

June-Hyoung Park, Myong R. Kim, and Wonho Jhe  »View Author Affiliations


Optics Letters, Vol. 25, Issue 9, pp. 628-630 (2000)
http://dx.doi.org/10.1364/OL.25.000628


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Abstract

The motion of the probe tip in a near-field scanning optical microscope, dithered by vibration of a tuning fork, can modulate the reflection signal from the sample surface not only at the fundamental dithering frequency but also at its second harmonic. By lock-in amplification of these modulated signals, enhanced optical images are obtained, even with an uncoated fiber probe. In particular, accurate optical images with higher resolution are obtained when the second-harmonic signal is detected, which results from the parametric modulation of the tip–sample separation at the double frequency of the horizontal dithering motion of the tip. Using a DVD ROM with a track pitch of 0.74 μm as a test sample, we observed that the sharp edges around the pits are clearly resolved with the second-harmonic signals and obtained enhanced resolution of ∼70 nm full width at half-maximum.

© 2000 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.5810) Microscopy : Scanning microscopy

Citation
June-Hyoung Park, Myong R. Kim, and Wonho Jhe, "Resolution enhancement in a reflection mode near-field optical microscope by second-harmonic modulation signals," Opt. Lett. 25, 628-630 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-9-628


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References

  1. D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984).
  2. E. Betzig, M. Isaacson, and A. Lewis, Appl. Phys. Lett. 51, 2088 (1987).
  3. K. Karrai and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).
  4. T. Pangarubuan, K. Yamada, S. Jiang, H. Ohsawa, and M. Ohtsu, Jpn. J. Appl. Phys. 31, L1302 (1992).
  5. S. K. Eah, J. H. Park, and W. Jhe, in Technical Digest of the Fifth International Conference on Near-Field Optics (Japan Society of Applied Physics, Tokyo, 1998), p. 163.
  6. E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992).
  7. V. Sandoghdar, S. Wegscheider, G. Krausch, and J. Mlynek, J. Appl. Phys. 31, 2499 (1997).

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