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Optics Letters

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  • Vol. 26, Iss. 10 — May. 15, 2001
  • pp: 707–709

Fundamentals and model of photonic-force microscopy

M. Lester, J. R. Arias-González, and M. Nieto-Vesperinas  »View Author Affiliations


Optics Letters, Vol. 26, Issue 10, pp. 707-709 (2001)
http://dx.doi.org/10.1364/OL.26.000707


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Abstract

Exact calculations of the near-field electromagnetic force on a nanoparticle exerted by the presence of a corrugated dielectric interface are carried out. The illumination of this system excites the particle eigenmodes. The calculation is two-dimensional, so the nanoparticle is actually a nanocylinder that scans parallel to the interface. This system constitutes a model of force transduction and surface topography imaging for a photonic-force microscope with signal enhancement owing to morphological resonance excitation of the probe.

© 2001 Optical Society of America

OCIS Codes
(170.5810) Medical optics and biotechnology : Scanning microscopy
(260.2110) Physical optics : Electromagnetic optics
(260.5740) Physical optics : Resonance
(290.4210) Scattering : Multiple scattering

Citation
M. Lester, J. R. Arias-González, and M. Nieto-Vesperinas, "Fundamentals and model of photonic-force microscopy," Opt. Lett. 26, 707-709 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-10-707


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