We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution.
© 2001 Optical Society of America
P. Scott Carney and John C. Schotland, "Three-dimensional total internal reflection microscopy," Opt. Lett. 26, 1072-1074 (2001)