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Optics Letters

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  • Vol. 26, Iss. 16 — Aug. 15, 2001
  • pp: 1265–1267

Giant birefringence in anisotropically nanostructured silicon

N. Künzner, D. Kovalev, J. Diener, E. Gross, V. Yu. Timoshenko, G. Polisski, F. Koch, and M. Fujii  »View Author Affiliations


Optics Letters, Vol. 26, Issue 16, pp. 1265-1267 (2001)
http://dx.doi.org/10.1364/OL.26.001265


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Abstract

We performed a study of the in-plane birefringence of anisotropically nanostructured Si layers, which exhibit a greater difference in the main value of the anisotropic refractive index than that of natural birefringent crystals. The anisotropy parameters were found to be strongly dependent on the typical size of the Si nanowires used to assemble the layers. This finding opens the possibility of an application of birefringent Si retarders to a wide spectral range for control of the polarization state of light.

© 2001 Optical Society of America

OCIS Codes
(060.4510) Fiber optics and optical communications : Optical communications
(160.1190) Materials : Anisotropic optical materials
(160.6000) Materials : Semiconductor materials
(230.3990) Optical devices : Micro-optical devices
(230.5440) Optical devices : Polarization-selective devices
(260.1440) Physical optics : Birefringence

Citation
N. Künzner, D. Kovalev, J. Diener, E. Gross, V. Yu. Timoshenko, G. Polisski, F. Koch, and M. Fujii, "Giant birefringence in anisotropically nanostructured silicon," Opt. Lett. 26, 1265-1267 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-16-1265


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