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Optics Letters

Optics Letters

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  • Vol. 26, Iss. 2 — Jan. 15, 2001
  • pp: 90–92

Phase-resolved correlation and its application to analysis of low-coherence interferograms

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, T. Yatagai, and M. Mori  »View Author Affiliations


Optics Letters, Vol. 26, Issue 2, pp. 90-92 (2001)
http://dx.doi.org/10.1364/OL.26.000090


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Abstract

A new signal-processing technique is proposed that involves a phase-resolved correlation method that one can use to determine the phase distribution of low-coherence interferograms. This method improves the sensitivity and resolution of low-coherence interferometers. The depth structure of an aluminum oxide–coated aluminum mirror was determined by use of a low-coherence interferometer with this method. Three signal peaks were successfully extracted from a noisy interferogram.

© 2001 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements

Citation
Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, T. Yatagai, and M. Mori, "Phase-resolved correlation and its application to analysis of low-coherence interferograms," Opt. Lett. 26, 90-92 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-2-90


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