A new signal-processing technique is proposed that involves a phase-resolved correlation method that one can use to determine the phase distribution of low-coherence interferograms. This method improves the sensitivity and resolution of low-coherence interferometers. The depth structure of an aluminum oxide–coated aluminum mirror was determined by use of a low-coherence interferometer with this method. Three signal peaks were successfully extracted from a noisy interferogram.
© 2001 Optical Society of America
(110.4500) Imaging systems : Optical coherence tomography
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, T. Yatagai, and M. Mori, "Phase-resolved correlation and its application to analysis of low-coherence interferograms," Opt. Lett. 26, 90-92 (2001)