Ellipsometric measurements by use of photon pairs generated by spontaneous parametric downconversion
Optics Letters, Vol. 26, Issue 21, pp. 1717-1719 (2001)
http://dx.doi.org/10.1364/OL.26.001717
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Abstract
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.
© 2001 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(190.0190) Nonlinear optics : Nonlinear optics
(270.0270) Quantum optics : Quantum optics
(350.4600) Other areas of optics : Optical engineering
Citation
Ayman F. Abouraddy, Kimani C. Toussaint, Jr., Alexander V. Sergienko, Bahaa E. A. Saleh, and Malvin C. Teich, "Ellipsometric measurements by use of photon pairs generated by spontaneous parametric downconversion," Opt. Lett. 26, 1717-1719 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-21-1717
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