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Optics Letters

Optics Letters


  • Vol. 26, Iss. 23 — Dec. 1, 2001
  • pp: 1864–1866

Differential phase measurements in low-coherence interferometry without 2π ambiguity

Christoph K. Hitzenberger, Markus Sticker, Rainer Leitgeb, and Adolf F. Fercher  »View Author Affiliations

Optics Letters, Vol. 26, Issue 23, pp. 1864-1866 (2001)

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Quantitative phase measurements by low-coherence interferometry and optical coherence tomography are restricted by the well-known 2π ambiguity to path-length differences smaller than λ/2 . We present a method that overcomes this ambiguity. Introducing a slight dispersion imbalance between reference and sample arms of the interferometer causes the short and long wavelengths of the source spectrum to separate within the interferometric signal. This causes the phase slope to vary within the signal. The phase-difference function between two adjacent sample beam components is calculated by subtraction of their phase functions obtained from phase-sensitive interferometric signal recording. Because of the dispersive effect, the phase difference varies across the interferometric signal. The slope of that phase difference is proportional to the optical path difference, without 2π ambiguity.

© 2001 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(170.4500) Medical optics and biotechnology : Optical coherence tomography

Christoph K. Hitzenberger, Markus Sticker, Rainer Leitgeb, and Adolf F. Fercher, "Differential phase measurements in low-coherence interferometry without 2π ambiguity," Opt. Lett. 26, 1864-1866 (2001)

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