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Optics Letters

Optics Letters


  • Vol. 26, Iss. 6 — Mar. 15, 2001
  • pp: 322–324

Measurement of angular distributions by use of low-coherence interferometry for light-scattering spectroscopy

Adam Wax, Changhuei Yang, Ramachandra R. Dasari, and Michael S. Feld  »View Author Affiliations

Optics Letters, Vol. 26, Issue 6, pp. 322-324 (2001)

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We present a novel interferometer for measuring angular distributions of backscattered light. The new system exploits a low-coherence source in a modified Michelson interferometer to provide depth resolution, as in optical coherence tomography, but includes an imaging system that permits the angle of the reference field to be varied in the detector plane by simple translation of an optical element. We employ this system to examine the angular distribution of light scattered by polystyrene microspheres. The measured data indicate that size information can be recovered from angular-scattering distributions and that the coherence length of the source influences the applicability of Mie theory.

© 2001 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.4020) Scattering : Mie theory

Adam Wax, Changhuei Yang, Ramachandra R. Dasari, and Michael S. Feld, "Measurement of angular distributions by use of low-coherence interferometry for light-scattering spectroscopy," Opt. Lett. 26, 322-324 (2001)

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