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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 26, Iss. 6 — Mar. 15, 2001
  • pp: 382–384

Quadrature spectral interferometric detection and pulse shaping

Feng Huang, Weiguo Yang, and Warren S. Warren  »View Author Affiliations


Optics Letters, Vol. 26, Issue 6, pp. 382-384 (2001)
http://dx.doi.org/10.1364/OL.26.000382


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Abstract

We introduce a new variant of spectral interferometry, using spectrally dispersed ultrafast laser pulses and quadrature detection to measure optical thickness variations related to surface structure. We can resolve surface features with depths of 3 mm to 25 nm, using a lateral resolution of ~100μm . Quadrature detection gives a larger dynamic range and solves the sign ambiguity problem. This method has potential applications in device manufacture, optical communications, and error compensation in pulse shaping.

© 2001 Optical Society of America

OCIS Codes
(180.3170) Microscopy : Interference microscopy
(320.0320) Ultrafast optics : Ultrafast optics
(320.5540) Ultrafast optics : Pulse shaping
(320.7100) Ultrafast optics : Ultrafast measurements

Citation
Feng Huang, Weiguo Yang, and Warren S. Warren, "Quadrature spectral interferometric detection and pulse shaping," Opt. Lett. 26, 382-384 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-6-382

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