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Optics Letters

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  • Vol. 26, Iss. 7 — Apr. 1, 2001
  • pp: 468–470

Molybdenum–strontium multilayer mirrors for the 8–12-nm extreme-ultraviolet wavelength region

Benjawan Sae-Lao and Claude Montcalm  »View Author Affiliations


Optics Letters, Vol. 26, Issue 7, pp. 468-470 (2001)
http://dx.doi.org/10.1364/OL.26.000468


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Abstract

Mo–Sr multilayer mirrors were successfully deposited by dc-magnetron sputtering and characterized in situ with synchrotron radiation. Normal-incidence (3.6°) reflectance of 23.0% at 8.8 nm, 40.8% at 9.4 nm, and 48.3% at 10.5 nm were measured before the samples were exposed to air. After exposure, as a result of the reactivity of Sr with oxygen and water vapor, the reflectance of these multilayers decreased rapidly. Attempts to use thin layers of C to passivate the surface of these Mo–Sr multilayers were unsuccessful.

© 2001 Optical Society of America

OCIS Codes
(230.4170) Optical devices : Multilayers
(310.6860) Thin films : Thin films, optical properties
(340.7470) X-ray optics : X-ray mirrors

Citation
Benjawan Sae-Lao and Claude Montcalm, "Molybdenum–strontium multilayer mirrors for the 8–12-nm extreme-ultraviolet wavelength region," Opt. Lett. 26, 468-470 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-7-468


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References

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  4. A tabulation of measured normal-incidence reflectances, scattering factors of all materials, and details on the synchrotron beamline used for these experiments can be found at www-cxro.lbl.gov.
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