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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 27, Iss. 10 — May. 15, 2002
  • pp: 836–838

Fast position measurements with scanning line optical tweezers

Rajalakshmi Nambiar and Jens-Christian Meiners  »View Author Affiliations


Optics Letters, Vol. 27, Issue 10, pp. 836-838 (2002)
http://dx.doi.org/10.1364/OL.27.000836


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Abstract

Scanning line optical tweezers are a powerful tool for the study of colloidal or biomolecular systems in the low-force regime. We present a fast, high-resolution particle position measurement scheme that extends the capabilities of these instruments into the realm of dynamic measurements. The technique is based on synchronous detection of forward-scattered laser light during a line scan. We demonstrate a position resolution of better than 50 nm for bandwidths of as much as 40 kHz for pairs of microspheres trapped in a flat line potential at center-to-center separations of 1.7–6 µm.

© 2002 Optical Society of America

OCIS Codes
(170.4520) Medical optics and biotechnology : Optical confinement and manipulation
(170.6920) Medical optics and biotechnology : Time-resolved imaging

Citation
Rajalakshmi Nambiar and Jens-Christian Meiners, "Fast position measurements with scanning line optical tweezers," Opt. Lett. 27, 836-838 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-10-836


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