Phase determination in interference-based superresolving microscopes through critical frequency analysis
Optics Letters, Vol. 27, Issue 11, pp. 888-890 (2002)
http://dx.doi.org/10.1364/OL.27.000888
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Abstract
Utilizing the interference of wave fronts of two opposing lenses, 4Pi-confocal and I5M microscopy improve the axial resolution of far-field fluorescence microscopy as much as threefold to sevenfold. However, establishing the phase difference of the wave fronts in the sample is a problem yet to be solved. Here we show that the phase difference is encoded in the microscope’s transfer of the spatial frequencies that match the distance of the interference peaks. As a result the phase difference is readily extracted through a Fourier transform of the image. Our method is relevant to all microscopes that exploit the interference of counterpropagating waves to improve the axial and the lateral resolution.
© 2002 Optical Society of America
[Optical Society of America ]
OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(110.4850) Imaging systems : Optical transfer functions
(170.1790) Medical optics and biotechnology : Confocal microscopy
(180.0180) Microscopy : Microscopy
(180.6900) Microscopy : Three-dimensional microscopy
(350.5730) Other areas of optics : Resolution
Citation
Stefan W. Hell, Carlo Mar Blanca, and Jörg Bewersdorf, "Phase determination in interference-based superresolving microscopes through critical frequency analysis," Opt. Lett. 27, 888-890 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-11-888
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