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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 27, Iss. 11 — Jun. 1, 2002
  • pp: 888–890

Phase determination in interference-based superresolving microscopes through critical frequency analysis

Stefan W. Hell, Carlo Mar Blanca, and Jörg Bewersdorf  »View Author Affiliations


Optics Letters, Vol. 27, Issue 11, pp. 888-890 (2002)
http://dx.doi.org/10.1364/OL.27.000888


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Abstract

Utilizing the interference of wave fronts of two opposing lenses, 4Pi-confocal and I5M microscopy improve the axial resolution of far-field fluorescence microscopy as much as threefold to sevenfold. However, establishing the phase difference of the wave fronts in the sample is a problem yet to be solved. Here we show that the phase difference is encoded in the microscope’s transfer of the spatial frequencies that match the distance of the interference peaks. As a result the phase difference is readily extracted through a Fourier transform of the image. Our method is relevant to all microscopes that exploit the interference of counterpropagating waves to improve the axial and the lateral resolution.

© 2002 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(110.4850) Imaging systems : Optical transfer functions
(170.1790) Medical optics and biotechnology : Confocal microscopy
(180.0180) Microscopy : Microscopy
(180.6900) Microscopy : Three-dimensional microscopy
(350.5730) Other areas of optics : Resolution

Citation
Stefan W. Hell, Carlo Mar Blanca, and Jörg Bewersdorf, "Phase determination in interference-based superresolving microscopes through critical frequency analysis," Opt. Lett. 27, 888-890 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-11-888

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