En face imaging of single cell layers by differential phase-contrast optical coherence microscopy
Optics Letters, Vol. 27, Issue 13, pp. 1126-1128 (2002)
http://dx.doi.org/10.1364/OL.27.001126
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Abstract
Optical coherence microscopy (OCM) is capable of imaging the backscattering potential of a sample with high transversal and axial resolution. We report on a combination of OCM with a differential phase-contrast technique that permits imaging of the subwavelength optical path differences that occur between a narrow beam probing a sample and its surrounding. This technique allows small transversal refractive-index variations close to a selected interface to be seen. We report on the method and present first images of a test sample and a single cell layer. The cells act as phase objects; imaging the phase properties improves the contrast compared with that of intensity images.
© 2002 Optical Society of America
OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(170.3880) Medical optics and biotechnology : Medical and biological imaging
(170.4500) Medical optics and biotechnology : Optical coherence tomography
(180.0180) Microscopy : Microscopy
Citation
Markus Sticker, Michael Pircher, Erich Götzinger, Harald Sattmann, Adolf F. Fercher, and Christoph K. Hitzenberger, "En face imaging of single cell layers by differential phase-contrast optical coherence microscopy," Opt. Lett. 27, 1126-1128 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-13-1126
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