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Optics Letters

Optics Letters


  • Vol. 27, Iss. 21 — Nov. 1, 2002
  • pp: 1899–1901

Imagery of local defects in multilayer components by short coherence length interferometry

L. Vabre, V. Loriette, A. Dubois, J. Moreau, and A. C. Boccara  »View Author Affiliations

Optics Letters, Vol. 27, Issue 21, pp. 1899-1901 (2002)

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We propose to image local defects inside multidielectric optical components by using a special configuration Linnik interference microscope, along with a CCD camera and a dedicated detection, to extract the amplitude scattered by the defects in the interference image. The use of a short coherence length source allows one to obtain interference only from a thin slice (~1µm) within the observed object. The object is tilted to permit the use of a dark-field configuration to enhance the defect contrast. We describe the experimental setup and the detection scheme. Images that exhibit local point defects on the interfaces of various multilayer optical components (laser mirrors) are presented.

© 2002 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(180.3170) Microscopy : Interference microscopy
(220.4840) Optical design and fabrication : Testing

L. Vabre, V. Loriette, A. Dubois, J. Moreau, and A. C. Boccara, "Imagery of local defects in multilayer components by short coherence length interferometry," Opt. Lett. 27, 1899-1901 (2002)

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