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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 27, Iss. 23 — Dec. 2, 2002
  • pp: 2127–2129

Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO

O. D. Mücke, T. Tritschler, M. Wegener, U. Morgner, and F. X. Kärtner  »View Author Affiliations


Optics Letters, Vol. 27, Issue 23, pp. 2127-2129 (2002)
http://dx.doi.org/10.1364/OL.27.002127


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Abstract

We excite ZnO samples with two-cycle optical pulses directly from a mode-locked oscillator with average powers of several tens of milliwatts. The emitted light reveals peaks at the carrier-envelope offset frequency fø and at 2fø in the radio-frequency spectra. These peaks can still be detected in layers as thin as 350 nm—a step toward determining the carrier-envelope offset phase itself.

© 2002 Optical Society of America

OCIS Codes
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(300.6470) Spectroscopy : Spectroscopy, semiconductors

Citation
O. D. Mücke, T. Tritschler, M. Wegener, U. Morgner, and F. X. Kärtner, "Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO," Opt. Lett. 27, 2127-2129 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-23-2127

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