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Optics Letters

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  • Vol. 27, Iss. 8 — Apr. 15, 2002
  • pp: 565–567

Phase-shifting whole-field speckle photography technique for the measurement of in-plane deformations in real time

N. Krishna Mohan and Pramod Rastogi  »View Author Affiliations


Optics Letters, Vol. 27, Issue 8, pp. 565-567 (2002)
http://dx.doi.org/10.1364/OL.27.000565


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Abstract

A new real-time phase-shifting readout system is developed for quantitative evaluation of full-field correlation fringes obtained by means of Fourier filtering in speckle photography. The proposed method, which uses photorefractive crystals as the recording medium, is capable of mapping the whole-field displacement data from the recorded phase-shifted fringe patterns. Experimental results are presented on a diffuse surface subjected to rotation in its own plane.

© 2002 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(110.6150) Imaging systems : Speckle imaging
(120.3940) Instrumentation, measurement, and metrology : Metrology
(160.5320) Materials : Photorefractive materials

Citation
N. Krishna Mohan and Pramod Rastogi, "Phase-shifting whole-field speckle photography technique for the measurement of in-plane deformations in real time," Opt. Lett. 27, 565-567 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-8-565


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References

  1. G. H. Kaufmann, in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), Chap. 9, pp. 427–472.
  2. K. Creath, in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1988), Vol. XXV, pp. 349–393.
  3. G. H. Kaufmann and P. Jacquot, Appl. Opt. 29, 3570 (1990).
  4. L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
  5. P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).

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