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Optics Letters

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  • Vol. 27, Iss. 9 — May. 1, 2002
  • pp: 754–756

Study of the mechanical interaction between an electromagnetic field and a nanoscopic thin film near electronic resonance

Takuya Iida and Hajime Ishihara  »View Author Affiliations


Optics Letters, Vol. 27, Issue 9, pp. 754-756 (2002)
http://dx.doi.org/10.1364/OL.27.000754


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Abstract

The mechanical interaction between an electromagnetic field and a nanoscopic thin film near electronic resonance is theoretically studied by calculation of Maxwell's stress tensor. As a result of numerical demonstrations for both propagating and evanescent incident waves, the following effects that are specific to this condition have been clarified: (1) The force exerted on a nanoscopic thin film is greatly enhanced near the resonance frequency to the same order of magnitude as for a film with macroscopic thickness. (2) The peak position of the gradient force in its spectrum is highly sensitive to the change in nanoscopic thickness that is due to the polaritonic effect. (3) In a total-reflection region a large enhancement of the repulsive force between the two thin films occurs when the films act as an optical cavity.

© 2002 Optical Society of America

OCIS Codes
(140.7010) Lasers and laser optics : Laser trapping
(220.4880) Optical design and fabrication : Optomechanics
(260.5740) Physical optics : Resonance
(310.0310) Thin films : Thin films

Citation
Takuya Iida and Hajime Ishihara, "Study of the mechanical interaction between an electromagnetic field and a nanoscopic thin film near electronic resonance," Opt. Lett. 27, 754-756 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-9-754


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References

  1. A. Ashkin, J. M. Dziedzic, J. E. Bjorkholm, and S. Chu, Opt. Lett. 11, 288 (1986).
  2. See H.-J. Guntherodt, D. Anselmetti, and E. Meyer, eds., Forces in Scanning Probe Method, Vol. 286 of NATO ASI Series (Kluwer Academic, Dordrecht, The Netherlands, 1995), p. 235.
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  5. S. Ito, H. Yoshikawa, and H. Masuhara, Appl. Phys. Lett. 78, 2566 (2001).
  6. C. Cohen-Tanoudji, in Fundamental Systems in Quantum Optics, J. Dalibard, J. Raimond, and J. Zinn-Justion, eds., Les Houches 1990 Sessions LIII (North-Holland, Amsterdam, 1992), p. 7.
  7. The force exerted on micrometer-order thin film by the evanescent wave was analyzed for the nonresonant case by T. Sugiura and S. Kawata, Bioimaging 1, 1 (1993).
  8. J. D. Jackson, Classical Electrodynamics, 3rd ed. (Wiley, New York, 1999), p. 258.

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