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Optics Letters

Optics Letters


  • Vol. 28, Iss. 13 — Jul. 1, 2003
  • pp: 1111–1113

Near-field scanning optical microscopy imaging of multimode interference

A. L. Campillo and J. W. P. Hsu  »View Author Affiliations

Optics Letters, Vol. 28, Issue 13, pp. 1111-1113 (2003)

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By use of a near-field scanning optical microscope (NSOM) in collection mode, the intensity distribution along a 2×2 multimode interference coupler was directly imaged as a function of wavelength. Although calculations can predict the general trend of wavelength dependence and the approximate positions of multiple images in the coupler, the accuracy is poor because of uncertainties in the waveguide width. We show that direct imaging using a NSOM bypasses calculational uncertainties and proves to be a powerful technique for studying these waveguide devices.

© 2003 Optical Society of America

OCIS Codes
(130.2790) Integrated optics : Guided waves
(130.3120) Integrated optics : Integrated optics devices
(180.5810) Microscopy : Scanning microscopy

A. L. Campillo and J. W. P. Hsu, "Near-field scanning optical microscopy imaging of multimode interference," Opt. Lett. 28, 1111-1113 (2003)

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