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Optics Letters

Optics Letters


  • Vol. 28, Iss. 13 — Jul. 1, 2003
  • pp: 1132–1134

Buried ion-exchanged glass waveguides:burial-depth dependence on waveguide width

P. Madasamy, B. R. West, M. M. Morrell, D. F. Geraghty, S. Honkanen, and N. Peyghambarian  »View Author Affiliations

Optics Letters, Vol. 28, Issue 13, pp. 1132-1134 (2003)

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A detailed theoretical and experimental study of the depth dependence of buried ion-exchanged waveguides on waveguide width is reported. Modeling, which includes the effect of nonhomogeneous time-dependent electric field distribution, agrees well with our experiments showing that burial depth increases linearly with waveguide width. These results may be used in the proper design of integrated optical circuits that need waveguides of different widths at different sections, such as arrayed waveguide gratings.

© 2003 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(130.0130) Integrated optics : Integrated optics
(230.7390) Optical devices : Waveguides, planar
(290.1990) Scattering : Diffusion

P. Madasamy, B. R. West, M. M. Morrell, D. F. Geraghty, S. Honkanen, and N. Peyghambarian, "Buried ion-exchanged glass waveguides:burial-depth dependence on waveguide width," Opt. Lett. 28, 1132-1134 (2003)

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  1. S. Honkanen, Proc. SPIE 53, 159 (1994).
  2. Y. Jaouen, L. du-Mouza, D. Barbier, J. M. Delavaux, and P. Bruno, IEEE Photon. Technol. Lett. 11, 1105 (1999).
  3. D. F. Geraghty, D. Provenzano, M. M. Morrell, S. Honkanen, A. Yariv, N. Peyghambarian, Electron. Lett. 37, 829 (2001).
  4. K. Okamoto, M. Moriwaki, and S. Suzuki, Electron. Lett. 31, 184 (1995).
  5. L. H. Spiekman, Y. S. Oei, E. G. Metaal, F. H. Groen, I. Moerman, and M. K. Smit, IEEE Photon. Technol. Lett. 6, 1008 (1994).
  6. B. Buchold and E. Voges, Electron. Lett. 32, 2249 (1996).
  7. J. Albert and J. W. Y. Lit, Appl. Opt. 29, 2798 (1990).
  8. D. Cheng, J. Saarinen, H. Saarikoski, and A. Tervonen, Opt. Commun. 137, 233 (1997).
  9. Jerome Hazart and V. Minier, IEEE J. Quantum Electron. 37, 606 (2001).
  10. R. G. Walker, C. D. W. Wilkinson, and J. A. H. Wilkinson, Appl. Opt. 22, 1923 (1983).
  11. R. V. Ramaswamy and R. Srivastava, J. Lightwave Technol. 6, 984 (1988).
  12. M. N. Weiss and R. Srivastava, Appl. Opt. 34, 455 (1995).
  13. L. Palchetti, E. Giorgetti, D. Grando, and S. Sottini, IEEE J. Quantum Electron. 34, 179 (1998).
  14. P. Madasamy, M. M. Morrell, D. F. Geraghty, S. Honkanen, N. Peyghambarian, in Technical Digest: Symposium on Optical Fiber Measurements, 2002, P. A. Williams G. W. Day, eds. (National Institute for Standards and Technology, Boulder, Colo., 2002), pp. 25–28.

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