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Optics Letters

Optics Letters


  • Vol. 28, Iss. 16 — Aug. 15, 2003
  • pp: 1424–1426

Imaging interferometric microscopy

Christian J. Schwarz, Yuliya Kuznetsova, and S. R. J. Brueck  »View Author Affiliations

Optics Letters, Vol. 28, Issue 16, pp. 1424-1426 (2003)

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We introduce and demonstrate a new microscopy concept: imaging interferometric microscopy (IIM), which is related to holography, synthetic-aperture imaging, and off-axis–dark-field illumination techniques. IIM is a wavelength-division multiplex approach to image formation that combines multiple images covering different spatial-frequency regions to form a composite image with a resolution much greater than that permitted by the same optical system using conventional techniques. This new type of microscopy involves both off-axis coherent illumination and reinjection of appropriate zero-order reference beams. Images demonstrate high resolution, comparable with that of a high-numerical-aperture (NA) objective, while they retain the long working distance, the large depth of field, and the large field of view of a low-NA objective. A Fourier-optics model of IIM is in good agreement with the experiment.

© 2003 Optical Society of America

OCIS Codes
(090.2880) Holography : Holographic interferometry
(100.2000) Image processing : Digital image processing
(100.6640) Image processing : Superresolution
(110.0180) Imaging systems : Microscopy
(180.0180) Microscopy : Microscopy
(180.3170) Microscopy : Interference microscopy

Christian J. Schwarz, Yuliya Kuznetsova, and S. R. J. Brueck, "Imaging interferometric microscopy," Opt. Lett. 28, 1424-1426 (2003)

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