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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 28, Iss. 18 — Sep. 15, 2003
  • pp: 1654–1656

Multiple imaging axis microscopy improves resolution for thick-sample applications

Jim Swoger, Jan Huisken, and Ernst H. K. Stelzer  »View Author Affiliations


Optics Letters, Vol. 28, Issue 18, pp. 1654-1656 (2003)
http://dx.doi.org/10.1364/OL.28.001654


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Abstract

The multiple imaging axis microscope (MIAM) is a wide-field optical microscope that observes a sample simultaneously from multiple directions without requiring the sample to be rotated or tilted. The prototype is capable of high-resolution imaging of the interior of a 300-μm -diameter sample consisting of fluorescent microbeads suspended in an agarose gel. Compared with a single-axis system, the MIAM can achieve a reduction of the axial point-spread function elongation by a factor of 5.8 and a 3.5-fold improvement in volume resolution by simple linear image combination techniques.

© 2003 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(110.6880) Imaging systems : Three-dimensional image acquisition
(180.2520) Microscopy : Fluorescence microscopy
(180.6900) Microscopy : Three-dimensional microscopy

Citation
Jim Swoger, Jan Huisken, and Ernst H. K. Stelzer, "Multiple imaging axis microscopy improves resolution for thick-sample applications," Opt. Lett. 28, 1654-1656 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-18-1654

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