We describe a double-grating interferometer that has a one-to-one correspondence with a Michelson interferometer. The half spatial periods of the gratings are equivalent to the wavelengths of the interferometer. The widths of the interference fringes can be changed easily. The intensity distribution of the interference pattern is independent of the wavelength of the light source used. The surface profile of an object can be measured because two interference beams can coincide precisely on the image plane of the object. The measuring range is much larger than that of a Michelson interferometer.
© 2003 Optical Society of America
(050.2770) Diffraction and gratings : Gratings
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
Yande Xu, Osami Sasaki, and Takamasa Suzuki, "Double-grating interferometer with a one-to-one correspondence with a Michelson interferometer," Opt. Lett. 28, 1751-1753 (2003)