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Optics Letters

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  • Vol. 28, Iss. 19 — Oct. 1, 2003
  • pp: 1751–1753

Double-grating interferometer with a one-to-one correspondence with a Michelson interferometer

Yande Xu, Osami Sasaki, and Takamasa Suzuki  »View Author Affiliations


Optics Letters, Vol. 28, Issue 19, pp. 1751-1753 (2003)
http://dx.doi.org/10.1364/OL.28.001751


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Abstract

We describe a double-grating interferometer that has a one-to-one correspondence with a Michelson interferometer. The half spatial periods of the gratings are equivalent to the wavelengths of the interferometer. The widths of the interference fringes can be changed easily. The intensity distribution of the interference pattern is independent of the wavelength of the light source used. The surface profile of an object can be measured because two interference beams can coincide precisely on the image plane of the object. The measuring range is much larger than that of a Michelson interferometer.

© 2003 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

Citation
Yande Xu, Osami Sasaki, and Takamasa Suzuki, "Double-grating interferometer with a one-to-one correspondence with a Michelson interferometer," Opt. Lett. 28, 1751-1753 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-19-1751

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