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Optics Letters

Optics Letters


  • Vol. 28, Iss. 20 — Oct. 15, 2003
  • pp: 1930–1932

Two-photon fluorescence scanning near-field microscopy based on a focused evanescent field under total internal reflection

James W. M. Chon, Min Gu, Craig Bullen, and Paul Mulvaney  »View Author Affiliations

Optics Letters, Vol. 28, Issue 20, pp. 1930-1932 (2003)

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We present two-photon fluorescence near-field microscopy based on an evanescent field focus produced by a ring beam under total internal reflection. The evanescent field produced by this method is focused by a high-numerical-aperture objective, producing a tightly confined volume that can effectively induce two-photon excitation. The imaging system is characterized by the two-photon-excited images of the nanocrystals, which show that the focused evanescent field is split into two lobes because of the enhancement of the longitudinal polarization component at the focus. This feature is confirmed by the theoretical prediction. Unlike other two-photon near-field probes, this method does not have the heating effect and requires no control mechanism of the distance between a sample and the probe.

© 2003 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.5810) Microscopy : Scanning microscopy
(190.4180) Nonlinear optics : Multiphoton processes

James W. M. Chon, Min Gu, Craig Bullen, and Paul Mulvaney, "Two-photon fluorescence scanning near-field microscopy based on a focused evanescent field under total internal reflection," Opt. Lett. 28, 1930-1932 (2003)

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