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Optics Letters

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  • Vol. 28, Iss. 21 — Nov. 1, 2003
  • pp: 2058–2060

Laser terahertz-emission microscope for inspecting electrical faults in integrated circuits

Toshihiko Kiwa, Masayoshi Tonouchi, Masatsugu Yamashita, and Kodo Kawase  »View Author Affiliations


Optics Letters, Vol. 28, Issue 21, pp. 2058-2060 (2003)
http://dx.doi.org/10.1364/OL.28.002058


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Abstract

A laser terahertz-emission microscope (LTEM) system is proposed and developed for inspecting electrical faults in integrated circuits (IC). We test a commercial operational amplifier while the system is operating. Two-dimensional terahertz-emission images of the IC chip are clearly observed while the chip is scanned with a femtosecond laser. When one of the interconnection lines is cut, the damaged chip has a LTEM image different from that of normal chips. The results indicate that the LTEM system is a potential tool for IC inspection.

© 2003 Optical Society of America

OCIS Codes
(110.2970) Imaging systems : Image detection systems
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology

Citation
Toshihiko Kiwa, Masayoshi Tonouchi, Masatsugu Yamashita, and Kodo Kawase, "Laser terahertz-emission microscope for inspecting electrical faults in integrated circuits," Opt. Lett. 28, 2058-2060 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-21-2058


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