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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 28, Iss. 22 — Nov. 15, 2003
  • pp: 2147–2149

Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling

Radouane Fikri, Thomas Grosges, and Dominique Barchiesi  »View Author Affiliations


Optics Letters, Vol. 28, Issue 22, pp. 2147-2149 (2003)
http://dx.doi.org/10.1364/OL.28.002147


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Abstract

In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.

© 2003 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(260.2110) Physical optics : Electromagnetic optics

Citation
Radouane Fikri, Thomas Grosges, and Dominique Barchiesi, "Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling," Opt. Lett. 28, 2147-2149 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-22-2147


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References

  1. C. Girard and D. Courjon, Surf. Sci. 382, 9 (1997).
  2. R. Hillenbrand and F. Keilmann, Appl. Phys. Lett. 80, 25 (2002).
  3. G. Wurtz, R. Bachelot, and P. Royer, Rev. Sci. Instrum. 69, 1735 (1998).
  4. A. Madrazo, R. Carminati, M. Nieto-Vesperinas, and J.-J. Greffet, J. Opt. Soc. Am. A 15, 109 (1998).
  5. P. Adam, J. L. Bijeon, G. Viardot, and P. Royer, Opt. Commun. 174, 91 (2000).
  6. J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
  7. S. Kawata and Y. Inouye, Ultramicroscopy 57, 313 (1995).
  8. R. Fikri, D. Barchiesi, F. H'Dhili, R. Bachelot, A. Vial, and P. Royer, Opt. Commun. 221, 13 (2003).
  9. S. Benrezzak, P. Adam, J. L. Bijeon, and P. Royer, Surf. Sci. 491, 195 (2001).
  10. R. Laddada, S. Benrezzak, P. Adam, G. Viradot, J.-L. Bijeon, and P. Royer, Eur. J. Appl. Phys. 6, 171 (1999).
  11. Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, J. Appl. Phys. 89, 5774 (2001).
  12. J. Jin, The Finite Element Method in Electromagnetics (Wiley, New York, 1993).

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