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Optics Letters

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  • Vol. 28, Iss. 23 — Dec. 1, 2003
  • pp: 2324–2326

Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm

Feng-Lei Hong, Atsushi Onae, Jie Jiang, Ruixiang Guo, Hajime Inaba, Kaoru Minoshima, Thomas R. Schibli, Hirokazu Matsumoto, and Ken’ichi Nakagawa  »View Author Affiliations


Optics Letters, Vol. 28, Issue 23, pp. 2324-2326 (2003)
http://dx.doi.org/10.1364/OL.28.002324


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Abstract

The absolute frequency of an acetylene-stabilized laser at 1542 nm is measured at its second harmonic (771 nm) by use of a femtosecond optical comb based on a mode-locked Ti:sapphire laser. Frequency stability and reproducibility of the acetylene-stabilized laser are evaluated by the femtosecond comb with a H maser as a frequency reference. The absolute frequency of a laser diode stabilized on the P(16) transition of 13C2H2 is determined to be 194 369 569 383.6(1.3) kHz. The acetylene-stabilized laser serves as an important optical frequency standard for telecommunication applications.

© 2003 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(300.6360) Spectroscopy : Spectroscopy, laser
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

Citation
Feng-Lei Hong, Atsushi Onae, Jie Jiang, Ruixiang Guo, Hajime Inaba, Kaoru Minoshima, Thomas R. Schibli, Hirokazu Matsumoto, and Ken’ichi Nakagawa, "Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm," Opt. Lett. 28, 2324-2326 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-23-2324


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