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Optics Letters

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  • Vol. 28, Iss. 3 — Feb. 1, 2003
  • pp: 149–151

Electron density characterization by use of a broadband x-ray-compatible wave-front sensor

K. L. Baker, J. Brase, M. Kartz, S. S. Olivier, B. Sawvel, and J. Tucker  »View Author Affiliations


Optics Letters, Vol. 28, Issue 3, pp. 149-151 (2003)
http://dx.doi.org/10.1364/OL.28.000149


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Abstract

The use of a Hartmann wave-front sensor to accurately measure the line-integrated electron density gradients formed in laser-produced and z-pinch plasma experiments is examined. This wave-front sensor may be used with a soft-x-ray laser as well as with incoherent line emission at multikilovolt x-ray energies. This diagnostic is significantly easier to use than interferometery and moiré deflectometry, both of which have been demonstrated with soft-x-ray lasers. This scheme is experimentally demonstrated in the visible region by use of a Shack–Hartmann wave-front sensor and a liquid-crystal spatial light modulator to simulate a phase profile that could occur when an x-ray probe passes through a plasma. The merits of using a Hartmann sensor include a wide dynamic range, broadband or low-coherence-length light capability, high x-ray efficiency, two-dimensional gradient determination, multiplexing capability, and experimental simplicity. Hartmann sensors could also be utilized for wavelength testing of extreme-ultraviolet lithography components and x-ray phase imaging of biological specimens.

© 2003 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
(350.5400) Other areas of optics : Plasmas

Citation
K. L. Baker, J. Brase, M. Kartz, S. S. Olivier, B. Sawvel, and J. Tucker, "Electron density characterization by use of a broadband x-ray-compatible wave-front sensor," Opt. Lett. 28, 149-151 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-3-149


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