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Optics Letters

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  • Vol. 28, Iss. 4 — Feb. 15, 2003
  • pp: 281–283

Single-shot kilohertz characterization of ultrashort pulses by spectral phase interferometry for direct electric-field reconstruction

W. Kornelis, J. Biegert, J. W. G. Tisch, M. Nisoli, G. Sansone, C. Vozzi, S. De Silvestri, and U. Keller  »View Author Affiliations


Optics Letters, Vol. 28, Issue 4, pp. 281-283 (2003)
http://dx.doi.org/10.1364/OL.28.000281


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Abstract

We describe a method of characterizing ultrashort optical pulses that is based on the technique of spectral phase interferometry for direct electric-field reconstruction and is capable of simultaneously measuring the amplitude and the phase of the electric field of a sub-10-fs pulse at kilohertz acquisition rates on a single-shot basis. Use of this technique results in a dramatic increase (>50×) in acquisition rate compared with that of existing diagnostics for full E -field characterization and opens the door to a range of new experiments in which shot-to-shot phase and amplitude fluctuations are studied at kilohertz rates.

© 2003 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.0320) Ultrafast optics : Ultrafast optics
(320.5550) Ultrafast optics : Pulses

Citation
W. Kornelis, J. Biegert, J. W. G. Tisch, M. Nisoli, G. Sansone, C. Vozzi, S. De Silvestri, and U. Keller, "Single-shot kilohertz characterization of ultrashort pulses by spectral phase interferometry for direct electric-field reconstruction," Opt. Lett. 28, 281-283 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-4-281


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