Single-shot kilohertz characterization of ultrashort pulses by spectral phase interferometry for direct electric-field reconstruction
Optics Letters, Vol. 28, Issue 4, pp. 281-283 (2003)
http://dx.doi.org/10.1364/OL.28.000281
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Abstract
We describe a method of characterizing ultrashort optical pulses that is based on the technique of spectral phase interferometry for direct electric-field reconstruction and is capable of simultaneously measuring the amplitude and the phase of the electric field of a sub-10-fs pulse at kilohertz acquisition rates on a single-shot basis. Use of this technique results in a dramatic increase (>50×) in acquisition rate compared with that of existing diagnostics for full E -field characterization and opens the door to a range of new experiments in which shot-to-shot phase and amplitude fluctuations are studied at kilohertz rates.
© 2003 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.0320) Ultrafast optics : Ultrafast optics
(320.5550) Ultrafast optics : Pulses
Citation
W. Kornelis, J. Biegert, J. W. G. Tisch, M. Nisoli, G. Sansone, C. Vozzi, S. De Silvestri, and U. Keller, "Single-shot kilohertz characterization of ultrashort pulses by spectral phase interferometry for direct electric-field reconstruction," Opt. Lett. 28, 281-283 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-4-281
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