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Profilometry based on two-photon absorption in a silicon avalanche photodiode

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Abstract

A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach–Zehnder interferometer.

© 2003 Optical Society of America

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