Profilometry based on two-photon absorption in a silicon avalanche photodiode
Optics Letters, Vol. 28, Issue 6, pp. 402-404 (2003)
http://dx.doi.org/10.1364/OL.28.000402
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Abstract
A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach–Zehnder interferometer.
© 2003 Optical Society of America
OCIS Codes
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(190.4360) Nonlinear optics : Nonlinear optics, devices
Citation
Yosuke Tanaka, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, and Mitsuo Takeda, "Profilometry based on two-photon absorption in a silicon avalanche photodiode," Opt. Lett. 28, 402-404 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-6-402
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