A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach–Zehnder interferometer.
© 2003 Optical Society of America
Yosuke Tanaka, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, and Mitsuo Takeda, "Profilometry based on two-photon absorption in a silicon avalanche photodiode," Opt. Lett. 28, 402-404 (2003)