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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 28, Iss. 6 — Mar. 15, 2003
  • pp: 402–404

Profilometry based on two-photon absorption in a silicon avalanche photodiode

Yosuke Tanaka, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, and Mitsuo Takeda  »View Author Affiliations


Optics Letters, Vol. 28, Issue 6, pp. 402-404 (2003)
http://dx.doi.org/10.1364/OL.28.000402


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Abstract

A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach–Zehnder interferometer.

© 2003 Optical Society of America

OCIS Codes
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(190.4360) Nonlinear optics : Nonlinear optics, devices

Citation
Yosuke Tanaka, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, and Mitsuo Takeda, "Profilometry based on two-photon absorption in a silicon avalanche photodiode," Opt. Lett. 28, 402-404 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-6-402

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