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Optics Letters

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  • Vol. 28, Iss. 9 — May. 1, 2003
  • pp: 689–691

Scattering at sidewall roughness in photonic crystal slabs

Wim Bogaerts, Peter Bienstman, and Roel Baets  »View Author Affiliations


Optics Letters, Vol. 28, Issue 9, pp. 689-691 (2003)
http://dx.doi.org/10.1364/OL.28.000689


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Abstract

We have simulated the effect of sidewall roughness in photonic-crystallike structures with different vertical refractive-index contrast. We treated the scattering off a sidewall irregularity as a radiating dipole excited by the incident waveguide mode. We show that the loss that is due to this scattering is significantly larger for structures with a low refractive-index contrast (such as GaAs/AlGaAs waveguides) than for structures with a high vertical index contrast (such as silicon-on-insulators and membranes).

© 2003 Optical Society of America

OCIS Codes
(250.5300) Optoelectronics : Photonic integrated circuits
(290.5880) Scattering : Scattering, rough surfaces

Citation
Wim Bogaerts, Peter Bienstman, and Roel Baets, "Scattering at sidewall roughness in photonic crystal slabs," Opt. Lett. 28, 689-691 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-9-689


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