The dynamic signature of the subwavelength variation of a slit is shown to be determinable from far-field irradiance with a precision of better than 1 nm. One can increase the efficiency of measurement of the subwavelength’s signature by adjusting the detection width over which the subwavelength variation is detected. The subwavelength variation of a rectangular aperture was also examined to show the general feasibility.
© 2004 Optical Society of America
Shu-Chun Chu and Jyh-Long Chern, "Characterization of the signature of subwavelength variation from far-field irradiance," Opt. Lett. 29, 1045-1047 (2004)