Abstract
We propose a sampling technique for measuring the shape of ultrashort soft-x-ray pulses. The technique uses the transient state of ions that is produced by the femtosecond sequential evolution of Kr ions during optical-field-induced ionization as an ultrafast x-ray-absorption sampling gate. We demonstrate the technique by measuring the pulse shape of the 51st harmonic (15.6 nm) generated by a 100-fs titanium:sapphire laser pulse. The measured pulse duration is 220 fs. Our experimental result confirms that the sequential evolution of ions from neutral Kr to is the dominant contribution to the ionization process from the aspect of time-domain measurement.
© 2004 Optical Society of America
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