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Optics Letters

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  • Vol. 29, Iss. 12 — Jun. 15, 2004
  • pp: 1408–1410

Surface plasmon polariton-based optical beam profiler

H. Ditlbacher, J. R. Krenn, A. Leitner, and F. R. Aussenegg  »View Author Affiliations


Optics Letters, Vol. 29, Issue 12, pp. 1408-1410 (2004)
http://dx.doi.org/10.1364/OL.29.001408


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Abstract

We describe a surface plasmon polariton– (SPP–) based device for measuring the intensity distribution of strongly focused light beams. A gold thin film configured as a sharp step is positioned in the focal region of a light beam, converting light into SPPs. The SPPs emit directional leakage radiation into the glass substrate beneath the thin film. The intensity of the leakage radiation is proportional to the intensity of the incident local light at the position of the step, allowing us to reconstruct the optical field profile by scanning the thin film’s edge through the focal region.

© 2004 Optical Society of America

OCIS Codes
(230.3990) Optical devices : Micro-optical devices
(240.6680) Optics at surfaces : Surface plasmons

Citation
H. Ditlbacher, J. R. Krenn, A. Leitner, and F. R. Aussenegg, "Surface plasmon polariton-based optical beam profiler," Opt. Lett. 29, 1408-1410 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-12-1408


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