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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 29, Iss. 13 — Jul. 1, 2004
  • pp: 1440–1442

Fabric inspection by near-infrared machine vision

María S. Millán and Jaume Escofet  »View Author Affiliations


Optics Letters, Vol. 29, Issue 13, pp. 1440-1442 (2004)
http://dx.doi.org/10.1364/OL.29.001440


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Abstract

Fabrics that have superstructures of colored squares, bands, etc., superimposed upon the basic web structure can be advantageously analyzed by use of near-infrared (NIR) illumination and a conventional monochrome camera. The reduction in contrast of the superstructure signal in the NIR image facilitates inspection of the fabric’s structure and defect segmentation. Underdetection and misdetection errors are noticeably reduced. This inspection takes advantage of the residual sensitivity of a monochrome camera, which can reach 1000 nm. The light source is an array of NIR LEDs emitting in a band to which the camera is still sensitive. NIR visual inspection can be performed by machines or by humans. In the latter case the observer looks at the NIR image of the fabric displayed on a TV monitor.

© 2004 Optical Society of America

OCIS Codes
(040.1490) Detectors : Cameras
(100.2960) Image processing : Image analysis
(130.3060) Integrated optics : Infrared
(150.0150) Machine vision : Machine vision
(150.2950) Machine vision : Illumination
(150.3040) Machine vision : Industrial inspection

Citation
María S. Millán and Jaume Escofet, "Fabric inspection by near-infrared machine vision," Opt. Lett. 29, 1440-1442 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-13-1440


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References

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