OSA's Digital Library

Optics Letters

Optics Letters


  • Vol. 29, Iss. 15 — Aug. 1, 2004
  • pp: 1727–1729

Fast profile measurement of micrometer-sized tapered fibers with better than 50-nm accuracy

Florian Warken and Harald Giessen  »View Author Affiliations

Optics Letters, Vol. 29, Issue 15, pp. 1727-1729 (2004)

View Full Text Article

Acrobat PDF (828 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The forward scattering of light illuminating a transparent dielectric cylinder, such as a tapered fiber, from the side can be understood as interference of the diffracted, reflected, and transmitted light. Additionally, light can be resonantly coupled into the fiber if a multiple of the wavelength matches the circumference. Using a suitable laser setup with a novel evaluation algorithm allows us to quickly extract the fiber radius from the complex diffraction pattern, obtaining an accuracy of better than 50 nm. We demonstrate experimentally our method, which is noncontact and allows one to simultaneously measure the profile of a several-centimeter-long fiber waist with a diameter near the diffraction limit.

© 2004 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements

Florian Warken and Harald Giessen, "Fast profile measurement of micrometer-sized tapered fibers with better than 50-nm accuracy," Opt. Lett. 29, 1727-1729 (2004)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. T. A. Birks, W. J. Wadsworth, and P. St. J. Russell, Opt. Lett. 25, 1415 (2000).
  2. J. Teipel, K. Franke, D. Turke, F. Warken, D. Meiser, M. Leuschner, and H. Giessen, Appl. Phys. B 77, 245 (2003).
  3. Th. Udem, R. Holzwarth, and T. W. Hänsch, Nature 416, 233 (2002).
  4. J. Teipel and H. Giessen, in Conference on Lasers and Electro-Optics (CLEO), Postconference Digest, Vol. 88 of OSA Trends in Optics and Photonics Series (Optical Society of America, Washington, D.C., 2003), p. 58.
  5. S. M. Spillane, T. J. Klippenberg, and K. J. Vahala, Nature 415, 621 (2002).
  6. K. J. Vahala, Nature 424, 839 (2003).
  7. J. C. Knight, G. Cheung, F. Jacques, and T. A. Birks, Opt. Lett. 22, 1129 (1997).
  8. T. A. Birks, J. C. Knight, and T. E. Dimmick, IEEE Photon. Technol. Lett. 12, 182 (2000).
  9. M. Cai, O. Painter, and K. J. Vahala, Phys. Rev. Lett. 85, 74 (2000).
  10. F. Lissilour, F. D. Messager, G. Stéphan, and P. Féron, Opt. Lett. 26, 1051 (2001).
  11. R. P. Kenny, T. A. Birks, and K. P. Oakley, Electron. Lett. 27, 1654 (1991).
  12. T. A. Birks and Y. W. Li, J. Lightwave Technol. 10, 432 (1992).
  13. M. B. van der Mark and L. Bosselaar, J. Lightwave Technol. 12, 1 (1994).
  14. D. H. Smithgall, L. S. Watkins, and R. E. Frazee, Jr., Appl. Opt. 16, 2395 (1977).
  15. A. W. Poon, R. K. Chang, and D. Q. Chowdhury, Opt. Lett. 26, 1867 (2001).
  16. L. G. Guimaraes and H. M. Nussenzveig, J. Mod. Opt. 41, 625 (1994).
  17. H. C. van de Hulst, Light Scattering by Small Particles (Wiley, New York, 1957).
  18. C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1983).
  19. S. Kozaki, J. Appl. Phys. 53, 7195 (1982).
  20. D. J. Butler and G. W. Forbes, Appl. Opt. 37, 2598 (1998).
  21. L. S. Watkins, J. Opt. Soc. Am. 64, 767 (1974).
  22. L. Tong, R. Gattass, J. Ashcom, S. He, J. Lou, M. Shen, I. Maxwell, and E. Mazur, Nature 426, 816 (2003).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited