Chromatic confocal microscopy with a finite pinhole size
Optics Letters, Vol. 29, Issue 18, pp. 2130-2132 (2004)
http://dx.doi.org/10.1364/OL.29.002130
Acrobat PDF (794 KB)
Abstract
Chromatic confocal microscopy has the advantage of short measurement times because of its parallel depth scan. As most white-light sources have limited optical output power, light-efficient setups are necessary. Using an extended detection pinhole is one way to improve light efficiency. We have calculated the effect of extended pinholes in chromatic confocal setups. We found that, for certain pinhole sizes, the FWHM of the confocal signal is nearly constant over a large wavelength interval.
© 2004 Optical Society of America
OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(150.6910) Machine vision : Three-dimensional sensing
(180.1790) Microscopy : Confocal microscopy
(180.6900) Microscopy : Three-dimensional microscopy
Citation
A. K. Ruprecht, T. F. Wiesendanger, and H. J. Tiziani, "Chromatic confocal microscopy with a finite pinhole size," Opt. Lett. 29, 2130-2132 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-18-2130
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Time multiplexing and parallelization in multifocal multiphoton microscopy (JOSAA)
- Superresolving masks for incoherent high-numerical-aperture scanning microscopy in three dimensions (JOSAA)
- Reflection-type confocal readout for multilayered optical memory (OL)
- Low-Coherence Fiber-Optic Sensor with a Large Numerical Aperture for Topographic Measurements (AO)
- Unified Calibration Technique and its Applications in Optical Triangular Profilometry (AO)
Related Conference Papers
- Spatial Position Detection of Three-Dimensional Object Using Complex Amplitude Derived from Fourier Transform Profilometry
- Fisher Information of 3D Rotating Point Spread Functions
- Information Content of the Near-Field: Three-Dimensional Samples
- Near-Field Inverse Scattering: The Current State of Theory and Experiment
- isoSTED Microscopy
« Previous Article | Next Article »
OSA is a member of 