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Optics Letters

Optics Letters


  • Vol. 29, Iss. 20 — Oct. 15, 2004
  • pp: 2435–2437

Determining thickness independently from optical constants by use of ultrafast light

Feng Huang, John F. Federici, and Dale Gary  »View Author Affiliations

Optics Letters, Vol. 29, Issue 20, pp. 2435-2437 (2004)

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We show that the application of ultrafast techniques, especially terahertz time-domain spectroscopy, allows simultaneous measurements of material thickness and optical constants from transmission measurements, by analyzing not only the phase difference between the main terahertz pulse through the medium but also the subsequent multireflection pulse (an echo) from the medium. Such a method provides a fast and precise characterization of the optical properties and can extract thickness information and hence other optical constants in a broad bandwidth. It may have applications in science and engineering such as in situ film thickness and quality monitoring, optical constants measurement, medical imaging, noninvasive detection, and remote sensing.

© 2004 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(300.6530) Spectroscopy : Spectroscopy, ultrafast
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology

Feng Huang, John F. Federici, and Dale Gary, "Determining thickness independently from optical constants by use of ultrafast light," Opt. Lett. 29, 2435-2437 (2004)

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