Refractive microlens array for wave-front analysis in the medium to hard x-ray range
Optics Letters, Vol. 29, Issue 8, pp. 866-868 (2004)
http://dx.doi.org/10.1364/OL.29.000866
Acrobat PDF (614 KB)
Abstract
We report an alternative approach to x-ray wave-front analysis that uses a refractive microlens array as a Shack–Hartmann sensor. The sensor was manufactured by self-assembly and electroplating techniques and is suitable for high-resolution wave-front analysis of medium to hard x rays. We demonstrate its effectiveness at an x-ray energy of 3 keV for analysis of x-ray wave-front perturbations caused by microscopic objects. The sensor has potential advantages over other methods for x-ray phase imaging and will also be useful for the characterization of x-ray beams and optics.
© 2004 Optical Society of America
OCIS Codes
(340.0340) X-ray optics : X-ray optics
(340.7460) X-ray optics : X-ray microscopy
Citation
Sheridan C. Mayo and Brett Sexton, "Refractive microlens array for wave-front analysis in the medium to
hard x-ray range," Opt. Lett. 29, 866-868 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-8-866
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Fast Imaging of Hard X Rays with a Laboratory Microscope (AO)
- Influence of Fabrication Errors on Wölter Mirror Imaging Performance (AO)
- Design and Imaging Performance of Achromatic Diffractive-Refractive X-Ray and Gamma-Ray Fresnel Lenses (AO)
- Efficiency of an Elliptically Shaped X-Ray Mirror (AO)
- Phase contrast soft x-ray microscopy using Zernike zone plates (OE)
« Previous Article | Next Article »
OSA is a member of 