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Optics Letters

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  • Vol. 29, Iss. 8 — Apr. 15, 2004
  • pp: 866–868

Refractive microlens array for wave-front analysis in the medium to hard x-ray range

Sheridan C. Mayo and Brett Sexton  »View Author Affiliations


Optics Letters, Vol. 29, Issue 8, pp. 866-868 (2004)
http://dx.doi.org/10.1364/OL.29.000866


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Abstract

We report an alternative approach to x-ray wave-front analysis that uses a refractive microlens array as a Shack–Hartmann sensor. The sensor was manufactured by self-assembly and electroplating techniques and is suitable for high-resolution wave-front analysis of medium to hard x rays. We demonstrate its effectiveness at an x-ray energy of 3 keV for analysis of x-ray wave-front perturbations caused by microscopic objects. The sensor has potential advantages over other methods for x-ray phase imaging and will also be useful for the characterization of x-ray beams and optics.

© 2004 Optical Society of America

OCIS Codes
(340.0340) X-ray optics : X-ray optics
(340.7460) X-ray optics : X-ray microscopy

Citation
Sheridan C. Mayo and Brett Sexton, "Refractive microlens array for wave-front analysis in the medium to hard x-ray range," Opt. Lett. 29, 866-868 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-8-866


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