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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 3, Iss. 4 — Oct. 1, 1978
  • pp: 133–135

Fourier description of analysis and synthesis operations for a stack of thin films of equal optical thickness

I. J. Hodgkinson  »View Author Affiliations


Optics Letters, Vol. 3, Issue 4, pp. 133-135 (1978)
http://dx.doi.org/10.1364/OL.3.000133


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Abstract

Analysis and synthesis operations for a stack of dielectric layers with equal optical thickness are described in terms of the Wiener–Khintchine theorem with variables reflectance R and distribution of optical paths f. The method yields an infinite sequence of refractive indices that converge to a substrate index. An iterative process is used to determine the minimum phase solution, and all practical solutions are constructed from it by a root-shifting procedure. Realizability and practicability conditions are discussed.

© 1978 Optical Society of America

History
Original Manuscript: June 1, 1978
Published: October 1, 1978

Citation
I. J. Hodgkinson, "Fourier description of analysis and synthesis operations for a stack of thin films of equal optical thickness," Opt. Lett. 3, 133-135 (1978)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-3-4-133

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