Fourier description of analysis and synthesis operations for a stack of thin films of equal optical thickness
Optics Letters, Vol. 3, Issue 4, pp. 133-135 (1978)
http://dx.doi.org/10.1364/OL.3.000133
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Abstract
Analysis and synthesis operations for a stack of dielectric layers with equal optical thickness are described in terms of the Wiener-Khintchine theorem with variables reflectance R and distribution of optical paths ƒ. The method yields an infinite sequence of refractive indices that converge to a substrate index. An iterative process is used to determine the minimum phase solution, and all practical solutions are constructed from it by a root-shifting procedure. Realizability and practicability conditions are discussed.
© 1978 Optical Society of America
Citation
I. J. Hodgkinson, "Fourier description of analysis and synthesis operations for a stack of thin films of equal optical thickness," Opt. Lett. 3, 133-135 (1978)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-3-4-133
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