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Optics Letters

Optics Letters


  • Vol. 3, Iss. 4 — Oct. 1, 1978
  • pp: 133–135

Fourier description of analysis and synthesis operations for a stack of thin films of equal optical thickness

I. J. Hodgkinson  »View Author Affiliations

Optics Letters, Vol. 3, Issue 4, pp. 133-135 (1978)

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Analysis and synthesis operations for a stack of dielectric layers with equal optical thickness are described in terms of the Wiener–Khintchine theorem with variables reflectance R and distribution of optical paths f. The method yields an infinite sequence of refractive indices that converge to a substrate index. An iterative process is used to determine the minimum phase solution, and all practical solutions are constructed from it by a root-shifting procedure. Realizability and practicability conditions are discussed.

© 1978 Optical Society of America

Original Manuscript: June 1, 1978
Published: October 1, 1978

I. J. Hodgkinson, "Fourier description of analysis and synthesis operations for a stack of thin films of equal optical thickness," Opt. Lett. 3, 133-135 (1978)

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  1. R. J. Pegis, J. Opt. Soc. Am. 51, 1255 (1961). [CrossRef]
  2. P. G. Kard, Opt. Spectrosc. 16, 497 (1964).
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