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  • Vol. 30, Iss. 10 — May. 15, 2005
  • pp: 1204–1206

Perfect corner reflector

Sébastien Guenneau, Boris Gralak, and J. B. Pendry  »View Author Affiliations


Optics Letters, Vol. 30, Issue 10, pp. 1204-1206 (2005)
http://dx.doi.org/10.1364/OL.30.001204


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Abstract

We numerically investigate the electromagnetic field radiated by a line source within a perfect lens [Phys. Rev. Lett.85, 3966 (2000)] consisting of two orthogonal planes delimiting positive and negative index media. Use of a coordinate transformation [J. Phys. Condens Matter 15, 6345 (2003)] together with a well-adapted transfer-matrix method permits rigorous calculation of the vector field. We find that two negative corners combine to make a cavity that traps light along closed trajectories. Finally, we numerically show that the field presents some spatial oscillations with a period that is proportional to absorption sigma inside the negative materials as 1/ln sigma and that it is associated with an infinite density of states when sigma tends toward 0.

© 2005 Optical Society of America

OCIS Codes
(110.4190) Imaging systems : Multiple imaging
(220.3630) Optical design and fabrication : Lenses
(260.2110) Physical optics : Electromagnetic optics

Citation
Sébastien Guenneau, Boris Gralak, and J. B. Pendry, "Perfect corner reflector," Opt. Lett. 30, 1204-1206 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-10-1204


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References

  1. J. B. Pendry, Phys. Rev. Lett. 85, 3966 (2000). [CrossRef]
  2. J. B. Pendry and S. A. Ramakrishna, J. Phys. Condens. Matter 15, 6345 (2003). [CrossRef]
  3. M. Notomi, Opt. Quantum Electron. 34, 133 (2002). [CrossRef]
  4. R. Merlin, Appl. Phys. Lett. 84, 1290 (2004). [CrossRef]
  5. B. Gralak, S. Guenneau, and J. B. Pendry are preparing a manuscript to be called "Transfer matrix formalism for point sources radiating in metamaterials."
  6. D. R. Smith, D. Schuring, M. Rosenbluth, S. Schultz, S. A. Ramakrishna, and J. B. Pendry, Appl. Phys. Lett. 82, 1506 (2003). [CrossRef]
  7. S. P. Apell, P. M. Echenique, and R. H. Ritchie, Ultramicroscopy 65, 53 (1996). [CrossRef]

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