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Optics Letters

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  • Vol. 30, Iss. 10 — May. 15, 2005
  • pp: 1228–1230

Mid-infrared electric field characterization using a visible charge-coupled-device-based spectrometer

Kevin J. Kubarych, Manuel Joffre, Amy Moore, Nadia Belabas, and David M. Jonas  »View Author Affiliations


Optics Letters, Vol. 30, Issue 10, pp. 1228-1230 (2005)
http://dx.doi.org/10.1364/OL.30.001228


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Abstract

We characterize ultrashort mid-infrared pulses through upconversion by using the stretched pulses obtained from the uncompressed output of a chirped-pulse amplifier. The power spectrum thus translated into the visible region can be readily measured with a standard silicon CCD camera-based spectrometer. The spectral phase is also characterized by a variant of zero-added-phase spectral phase interferometry for direct electric field reconstruction. This is a general method that provides a multiplex advantage over conventional infrared detector array-based methods.

© 2005 Optical Society of America

OCIS Codes
(320.7100) Ultrafast optics : Ultrafast measurements

Citation
Kevin J. Kubarych, Manuel Joffre, Amy Moore, Nadia Belabas, and David M. Jonas, "Mid-infrared electric field characterization using a visible charge-coupled-device-based spectrometer," Opt. Lett. 30, 1228-1230 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-10-1228


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