Abstract
Triple-layer omnidirectional reflectors (ODRs) consisting of a semiconductor, a quarter-wavelength transparent dielectric layer, and a metal have high reflectivities for all angles of incidence. Internal ODRs (ambient material’s refractive index ) are demonstrated that incorporate nanoporous , a low-refractive-index material , as well as dense . GaP and Ag serve as the semiconductor and the metal layer, respectively. Reflectivity measurements, including angular dependence, are presented. Calculated angle-integrated TE and TM reflectivities for ODRs employing nanoporous are and , respectively, indicating the high potential of the ODRs for low-loss waveguide structures.
© 2005 Optical Society of America
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