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Optics Letters

Optics Letters


  • Vol. 30, Iss. 13 — Jul. 1, 2005
  • pp: 1650–1653

Image of a straight edge in confocal self-interference microscopy

DongKyun Kang and DaeGab Gweon  »View Author Affiliations

Optics Letters, Vol. 30, Issue 13, pp. 1650-1653 (2005)

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An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10-90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10-90% width.

© 2005 Optical Society of America

OCIS Codes
(180.1790) Microscopy : Confocal microscopy
(260.1440) Physical optics : Birefringence
(260.3160) Physical optics : Interference
(350.5730) Other areas of optics : Resolution

DongKyun Kang and DaeGab Gweon, "Image of a straight edge in confocal self-interference microscopy," Opt. Lett. 30, 1650-1653 (2005)

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  1. D. Kang and D. Gweon, Opt. Lett. 28, 2470 (2003).
  2. D. Kang and D. Gweon, "Two-dimensional imaging theory of confocal self-interference microscopy," J. Opt. Soc. Am. A (to be published).
  3. T. Wilson and C. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1984).
  4. T. Wilson and S. J. Hewlett, Opt. Lett. 16, 1062 (1991).
  5. M. Kempe, W. Rudolph, and E. Welsch, J. Opt. Soc. Am. A 13, 46 (1996).

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