Image of a straight edge in confocal self-interference microscopy
Optics Letters, Vol. 30, Issue 13, pp. 1650-1653 (2005)
http://dx.doi.org/10.1364/OL.30.001650
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Abstract
An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10-90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10-90% width.
© 2005 Optical Society of America
OCIS Codes
(180.1790) Microscopy : Confocal microscopy
(260.1440) Physical optics : Birefringence
(260.3160) Physical optics : Interference
(350.5730) Other areas of optics : Resolution
Citation
DongKyun Kang and DaeGab Gweon, "Image of a straight edge in confocal self-interference microscopy," Opt. Lett. 30, 1650-1653 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-13-1650
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