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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 30, Iss. 15 — Aug. 1, 2005
  • pp: 2022–2024

Complete characterization of periodic optical sources by use of sampled test-plus-reference interferometry

Christophe Dorrer  »View Author Affiliations


Optics Letters, Vol. 30, Issue 15, pp. 2022-2024 (2005)
http://dx.doi.org/10.1364/OL.30.002022


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Abstract

An interferometric technique measuring the time-dependent electric field of a periodic optical source that uses samples of its interference with a reference source of short optical pulses is presented. Compared with other test-plus-reference techniques such as spectral interferometry and Fourier-transform spectroscopy, the technique is applicable when the signal under test and the reference signal do not originate from the same source. It is highly sensitive and allows the direct real-time characterization of optical sources and the extraction of a coherent periodic signal in an incoherent background.

© 2005 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(320.7160) Ultrafast optics : Ultrafast technology

Citation
Christophe Dorrer, "Complete characterization of periodic optical sources by use of sampled test-plus-reference interferometry," Opt. Lett. 30, 2022-2024 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-15-2022


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