We describe a novel microscopy technique for quantitative phase-contrast imaging of a transparent specimen. The technique is based on depth-resolved phase information provided by common path spectral-domain optical coherence tomography and can measure minute phase variations caused by changes in refractive index and thickness inside the specimen. We demonstrate subnanometer level path-length sensitivity and present images obtained on reflection from a known phase object and human epithelial cheek cells.
© 2005 Optical Society of America
(110.0180) Imaging systems : Microscopy
(110.4500) Imaging systems : Optical coherence tomography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(170.1530) Medical optics and biotechnology : Cell analysis
(180.3170) Microscopy : Interference microscopy
Chulmin Joo, Taner Akkin, Barry Cense, Boris H. Park, and Johannes F. de Boer, "Spectral-domain optical coherence phase microscopy for quantitative phase-contrast imaging," Opt. Lett. 30, 2131-2133 (2005)