A method for polarimetric measurement that uses a discrete space-variant subwavelength dielectric grating is presented. One retrieves the polarization state by measuring the far-field intensity of a beam emerging from the grating followed by a polarizer. The analysis for a partially polarized, quasi-monochromatic beam is performed by use of the beam coherence polarization matrix along with an extended van Cittert-Zernike theorem. We experimentally demonstrate polarization measurements of both fully and partially polarized light.
© 2005 Optical Society of America
(050.1960) Diffraction and gratings : Diffraction theory
(050.2770) Diffraction and gratings : Gratings
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.5440) Optical devices : Polarization-selective devices
(260.5430) Physical optics : Polarization
Yuri Gorodetski, Gabriel Biener, Avi Niv, Vladimir Kleiner, and Erez Hasman, "Space-variant polarization manipulation for far-field polarimetry by use of subwavelength dielectric gratings," Opt. Lett. 30, 2245-2247 (2005)