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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 19 — Oct. 1, 2005
  • pp: 2629–2631

Structurally perturbed chiral Bragg reflectors for elliptically polarized light

Ian Hodgkinson, Qi Hong Wu, Lakshman De Silva, Matthew Arnold, Akhlesh Lakhtakia, and Martin McCall  »View Author Affiliations


Optics Letters, Vol. 30, Issue 19, pp. 2629-2631 (2005)
http://dx.doi.org/10.1364/OL.30.002629


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Abstract

The structure of an inorganic chiral medium represented as a stack of identical form-birefringent layers that twist steadily with increasing thickness is perturbed by realigning a fraction of each layer to a fixed direction. Experimental results show that the resulting chiral-birefringent composite medium exhibits Bragg resonance with elliptically polarized light, and simulations indicate that Bragg reflectors can be designed for any polarization including linear.

© 2005 Optical Society of America

OCIS Codes
(160.1190) Materials : Anisotropic optical materials
(260.1440) Physical optics : Birefringence
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication

ToC Category:
Physical Optics

Citation
Ian Hodgkinson, Qi Hong Wu, Lakshman De Silva, Matthew Arnold, Akhlesh Lakhtakia, and Martin McCall, "Structurally perturbed chiral Bragg reflectors for elliptically polarized light," Opt. Lett. 30, 2629-2631 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-19-2629


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References

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